高会壮,王香芬,张芮,黄姣英

• 1:北京航空航天大学可靠性与系统工程学院

摘要(Abstract)：

为了解决高速光电耦合器的瞬态共模抑制不能准确测试的问题,研究了光耦的耦合机理和瞬态共模抑制的测试原理。利用仿真技术对电路功能及瞬态共模抑制评估电路的耦合参数(包括耦合电阻与耦合电容)进行仿真和验证,分析了电路中的不同器件参数对仿真结果的影响,并且对得到的输出波形的数据进行读取与分析。以HCPL-2611为例,使用大电阻和小电容并联的模型模拟实际中的耦合情况,通过仿真分析确定了耦合电容的大小,验证了高速光耦瞬态共模抑制仿真方法的有效性。

关键词(KeyWords)： 瞬态共模抑制;PSpice仿真;高压脉冲;耦合参数;耦合电阻;耦合电容

Abstract:

Keywords:

基金项目(Foundation): 国家自然科学基金(61376042)~~

作者(Author): 高会壮,王香芬,张芮,黄姣英

DOI: 10.16652/j.issn.1004-373x.2018.04.016

参考文献(References)：

• [1]WU Huiwei,HE Shengzong,CHEN Xuanlong,et al.Failure mechanisms and package reliability issues in optocouplers[C]//Proceedings of International Conference on Electronic Packaging Technology.Wuhan:IEEE,2016:1240-1243.
• [2]孙德刚,孙光.光耦线性化与线性光耦器件的应用[J].现代电子技术,2004,27(1):28-30.SUN Degang,SUN Guang.Optocoupler linearization and linear optocoupler′s application[J].Modern electronics technique,2004,27(1):28-30.
• [3]胡文金,江永清,吴英,等.数字光电耦合器隔离性能及动态特性测试仪[J].半导体光电,2008,29(3):341-344.HU Wenjin,JIANG Yongqing,WU Ying,et al.Digital optocoupler isolation performance and dynamic characteristic tester[J].Semiconductor optoelectronics,2008,29(3):341-344.
• [4]孙悦.基于低频噪声的光耦贮存寿命评价方法研究[D].北京:北京航空航天大学,2013:16-17.SUN Yue.Research on optocoupler′s storage life evaluation based on low frequency noise detection[D].Beijing:Beihang University,2013:16-17.
• [5]史玉琴,周婕,徐居明,等.空空导弹新研元器件可靠性保证方法研究[J].航空兵器,2014(2):61-64.SHI Yuqin,ZHOU Jie,XU Juming,et al.Research on reliability assurance of newly developed components of air-to-air missiles[J].Aero weaponry,2014(2):61-64.
• [6]包军林,庄奕琪,杜磊,等.光电耦合器件g-r噪声模型[J].半导体学报,2005,26(6):1208-1213.BAO Junlin,ZHUANG Yiqi,DU Lei,et al.A model for a g-r noise in optoelectronic coupled devices[J].Journal of semiconductors,2005,26(6):1208-1213.
• [7]DOBREV D.Simulate digital filters with PSpice[J/OL].[2015-05-23].https://www.researchgate.net/publication/277023347_Simulate_digital_filters_with_PSpice.
• [8]ZHANG Haiming.Design of an operational amplifier using PSPICE[J].Science and technology vision,2016(22):242-243.
• [9]JEVTI?M M.Low frequency noise as a tool to study optocouplers with phototransistors[J].Microelectronics
• [1]reliability,2004,44(7):1123-1129.
• [10]汪汉新.电路设计的PSpice仿真分析[J].现代电子技术,2003,26(15):42-44.WANG Hanxin.PSpice simulation analysis of circuit design[J].Modern electronics technique,2003,26(15):42-44.
• [11]黄晓宗,黄文刚,刘伦才,等.运算放大器共模抑制比的仿真与测试[J].微电子学,2012,42(2):154-158.HUANG Xiaozong,HUANG Wengang,LIU Luncai,et al.Simulation and test of common mode rejection ratio of operational amplifier[J].Microelectronics,2012,42(2):154-158.
• [12]WANG Y,WONG C M,CHUA T B.Galvanic isolator having improved high voltage common mode transient immunity:US7919781[P].2011-04-05.