基于SQLite的边界扫描测试链路自动生成研究与实现Research and implementation of SQLite based automatic generation for boundary scan testing chain
侯杏娜,陈寿宏,颜学龙
摘要(Abstract)：
为了提高边界扫描测试效率,提出一种基于嵌入式开源数据库SQLite的边界扫描测试链路自动生成方法。根据边界扫描编译结果得到SQLite数据库的各个数据表数据,分析各表间的数据关系,结合边界扫描矢量生成算法,从任意点随机触发,开始遍历数据库各表,引入模糊查询模式更有效匹配各表关系,快速形成完整边界扫描测试链。所设计的边界扫描链路自动生成方法可替代人工生成链路方法,简化测试准备和节省处理数据时所需时间,降低系统成本,具有较好的应用前景。
关键词(KeyWords)： 边界扫描;SQLite;链路生成;数据表;数据关系;模糊查询模式
基金项目(Foundation): 广西高校科研项目(YB2014119);; 广西自动检测技术与仪器重点实验室项目(YQ15101)~~
作者(Author): 侯杏娜,陈寿宏,颜学龙
DOI: 10.16652/j.issn.1004-373x.2018.08.016
参考文献(References)：
- [1]IEEE Standards Association.IEEE Std 1149.1-2001-IEEE standard test access port and boundary scan architecture[S].[S.l.]:IEEE,2001.
- [2]陈寿宏,颜学龙,黄新.基于IEEE 1149.7标准的CJTAG测试设计方法研究[J].电子技术应用,2013,39(1):79-82.CHEN Shouhong,YAN Xuelong,HUANG Xin.Research of the technology of CJTAG test method based on IEEE 1149.7[J].Application of electronic technique,2013,39(1):79-82.
- [3]陈寿宏,侯杏娜,韦翠荣,等.基于SQLite的边界扫描互连测试矢量生成设计[J].计算机测量与控制,2015,23(6):1854-1855.CHEN Shouhong,HOU Xingna,WEI Cuirong,et al.Design of boundary scan interconnect test vector generation based on SQLite[J].Computer measurement&control,2015,23(6):1854-1855.
- [4]CHEN Shouhong,WANG Zhuang,HOU Xingna,et al.A general boundary scan test system based on EDIF netlist file transfer to Protel netlist file[J].International journal of materials and structural integrity,2016,10(1):70-80.
- [5]GEBREMESKEL U I,FERREIRA J M M.An IEEE 1149.x embedded test coprocessor[J].Circuits&systems,2014,5(7):170-180.
- [6]UNGAR L Y.Boundary scan as a system-level diagnostic tool[C]//Proceedings of IEEE AUTOTESTCON.Anaheim:IEEE,2012:8-15.
- [7]LO W H,HSIEH A C,LAN C M,et al.Utilizing circuit structure for scan chain diagnosis[J].IEEE transactions on very large scale integration systems,2014,22(12):2766-2778.
- [8]POMERANZ I.Built-in generation of functional broadside tests using a fixed hardware structure[J].IEEE transactions on very large scale integration systems,2013,21(1):124-132.
- [9]IEEE Standards Association.IEEE Std 1149.7-2009-IEEE standard for reduced-pin and enhanced-functionality test access port and boundary-scan architecture[S].[S.l.]:IEEE,2010.
- [10]谭剑波,尤路,黄新,等.边界扫描测试技术[M].北京:国防工业出版社,2013.TAN Jianbo,YOU Lu,HUANG Xin,et al.Boundary scan test technology[M].Beijing:National Defense Industry Press,2013.